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Related identifier:
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Creator/Author:
Schliephake, Daniel https://orcid.org/0000-0001-8039-4975 [Werkstoffkunde]

Thota, Hemanth [Laboratorium für Elektronenmikroskopie]

Kauffmann, Alexander https://orcid.org/0000-0003-0059-3232 [Werkstoffkunde]

Wu, Huichao [Laboratorium für Elektronenmikroskopie]

Pundt, Astrid [Werkstoffkunde]

Heilmaier, Martin [Werkstoffkunde]

Eggeler, Yolita M. M. https://orcid.org/0000-0003-3645-0209 [Laboratorium für Elektronenmikroskopie]
Contributors:
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Title:
Raw Data to "The Creep-induced Micro- and Nanostructural Evolution of a Eutectic Mo-Si-Ti Alloy at 1200 °C"
Additional titles:
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Description:
(Technical Remarks) Raw data set to "The Creep-induced Micro- and Nanostructural Evolution of a Eutectic Mo-Si-Ti Alloy at 1200 °C". The data sets are labelled according to the figures in the manuscript. AC referes to the eutectic Mo-20Si-52.8Ti alloy in as-cast condtion HT refers to the eutectic Mo-20Si-52.8Ti alloy i...
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Subject areas:
Materials Science
Resource type:
Dataset
Data source:
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Data processing:
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Publication year:
Rights holders:

Thota, Hemanth

Wu, Huichao

Pundt, Astrid

Heilmaier, Martin
Funding:
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Status:
Published
Uploaded by:
kitopen
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Archiving date:
2024-03-28
Archive size:
754.3 MB
Archive creator:
kitopen
Archive checksum:
d8ddf2413fc49abd33458d1d92465bc2 (MD5)
Embargo period:
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